CVE-2023-21517 Memory corruption in Samsung Mobile Devices

High 8.8 Published 28 Jun 2023 Updated 4 Dec 2024

Remote attackers can execute arbitrary code via a heap out-of-bound write in the Exynos baseband of Samsung mobile devices.

Exploited in the wild: Not known
Login needed: Not needed
Attackable: Local or same network only
Victim action needed: Not needed
Fix: None listed

What is CVE-2023-21517?

CVE-2023-21517 is a high-severity memory corruption vulnerability in Samsung Mobile Devices, published on 28 Jun 2023. It can only be exploited from the same machine or local network, with no action from the victim.

Official description

Heap out-of-bound write vulnerability in Exynos baseband prior to SMR Jun-2023 Release 1 allows remote attacker to execute arbitrary code.

Weakness: CWE-787, CWE-120

Which versions are affected by CVE-2023-21517?

It affects 1 product.

Products include Samsung Exynos.

How do I fix CVE-2023-21517?

No fix has been published for CVE-2023-21517 yet. Limit exposure of the affected software until one is available.

Upgrade to the fixed version. Memory-safe languages, compiler hardening and fuzzing prevent most new cases. More about Memory corruption.

Is CVE-2023-21517 being exploited?

There is no known exploitation of CVE-2023-21517 in the wild and no public exploit code.

Sources

Also known as GHSA-j3q7-q94g-fmjj.